CMOS Characterization and Compact Modelling for Circuit Reliability Simulation - researchr publication authors

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Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández. CMOS Characterization and Compact Modelling for Circuit Reliability Simulation. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 139-142, IEEE, 2018. [doi]

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