Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández. CMOS Characterization and Compact Modelling for Circuit Reliability Simulation. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 139-142, IEEE, 2018. [doi]
@inproceedings{Diaz-FortunyMRN18,
title = {CMOS Characterization and Compact Modelling for Circuit Reliability Simulation},
author = {Javier Diaz-Fortuny and Javier Martín-Martínez and Rosana Rodríguez and Montserrat Nafría and Rafael Castro-López and Elisenda Roca and Francisco V. Fernández},
year = {2018},
doi = {10.1109/IOLTS.2018.8474244},
url = {https://doi.org/10.1109/IOLTS.2018.8474244},
researchr = {https://researchr.org/publication/Diaz-FortunyMRN18},
cites = {0},
citedby = {0},
pages = {139-142},
booktitle = {24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018},
editor = {Dimitris Gizopoulos and Dan Alexandrescu and Mihalis Maniatakos and Panagiota Papavramidou},
publisher = {IEEE},
isbn = {978-1-5386-5992-2},
}