A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation - researchr publication authors

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Javier Diaz-Fortuny, P. Saraza-Canflanca, A. Toro-Frias, R. Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría. A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 53-56, IEEE, 2018. [doi]

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