Javier Diaz-Fortuny, P. Saraza-Canflanca, A. Toro-Frias, R. Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría. A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 53-56, IEEE, 2018. [doi]
@inproceedings{Diaz-FortunySTC18,
title = {A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation},
author = {Javier Diaz-Fortuny and P. Saraza-Canflanca and A. Toro-Frias and R. Castro-López and Javier Martín-Martínez and Elisenda Roca and Rosana Rodríguez and Francisco V. Fernández and Montserrat Nafría},
year = {2018},
doi = {10.1109/SMACD.2018.8434867},
url = {https://doi.org/10.1109/SMACD.2018.8434867},
researchr = {https://researchr.org/publication/Diaz-FortunySTC18},
cites = {0},
citedby = {0},
pages = {53-56},
booktitle = {15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5153-7},
}