Sebastian Dietel, Sebastian Höppner, Holger Eisenreich, Georg Ellguth, Stefan Hänzsche, Stephan Henker, René Schüffny, Tim Brauninger, Ulrich Fiedler. A compact on-chip IR-drop measurement system in 28 nm CMOS technology. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 1219-1222, IEEE, 2014. [doi]
Abstract is missing.