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F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra. An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET s. Microelectronics Reliability, 41(9-10):1417-1420, 2001.
Abstract is missing.