Luigi Dilillo, Bashir M. Al-Hashimi. March CRF: an Efficient Test for Complex Read Faults in SRAM Memories. In Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino, editors, Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007. pages 173-178, IEEE Computer Society, 2007.
@inproceedings{DililloA07,
title = {March CRF: an Efficient Test for Complex Read Faults in SRAM Memories},
author = {Luigi Dilillo and Bashir M. Al-Hashimi},
year = {2007},
tags = {testing},
researchr = {https://researchr.org/publication/DililloA07},
cites = {0},
citedby = {0},
pages = {173-178},
booktitle = {Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007},
editor = {Patrick Girard and Andrzej Krasniewski and Elena Gramatová and Adam Pawlak and Tomasz Garbolino},
publisher = {IEEE Computer Society},
isbn = {1-4244-1161-0},
}