Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard. Minimizing test power in SRAM through reduction of pre-charge activity. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1159-1164, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
@inproceedings{DililloRAG06,
title = {Minimizing test power in SRAM through reduction of pre-charge activity},
author = {Luigi Dilillo and Paul M. Rosinger and Bashir M. Al-Hashimi and Patrick Girard},
year = {2006},
doi = {10.1145/1131802},
url = {http://doi.acm.org/10.1145/1131802},
tags = {testing},
researchr = {https://researchr.org/publication/DililloRAG06},
cites = {0},
citedby = {0},
pages = {1159-1164},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006},
editor = {Georges G. E. Gielen},
publisher = {European Design and Automation Association, Leuven, Belgium},
isbn = {3-9810801-0-6},
}