Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard. Minimizing test power in SRAM through reduction of pre-charge activity. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1159-1164, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
Abstract is missing.