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Built-in test of millimeter-Wave circuits based on non-intrusive sensors

Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld. Built-in test of millimeter-Wave circuits based on non-intrusive sensors. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 505-510, IEEE, 2016. [doi]

Authors

Athanasios Dimakos

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Haralampos-G. D. Stratigopoulos

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Alexandre Siligaris

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Salvador Mir

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Emeric de Foucauld

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