Built-in test of millimeter-Wave circuits based on non-intrusive sensors

Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld. Built-in test of millimeter-Wave circuits based on non-intrusive sensors. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 505-510, IEEE, 2016. [doi]

Abstract

Abstract is missing.