AENEID: a generic lithography-friendly detailed router based on post-RET data learning and hotspot detection

Duo Ding, Jhih-Rong Gao, Kun Yuan, David Z. Pan. AENEID: a generic lithography-friendly detailed router based on post-RET data learning and hotspot detection. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 795-800, ACM, 2011. [doi]

@inproceedings{DingGYP11,
  title = {AENEID: a generic lithography-friendly detailed router based on post-RET data learning and hotspot detection},
  author = {Duo Ding and Jhih-Rong Gao and Kun Yuan and David Z. Pan},
  year = {2011},
  doi = {10.1145/2024724.2024902},
  url = {http://doi.acm.org/10.1145/2024724.2024902},
  researchr = {https://researchr.org/publication/DingGYP11},
  cites = {0},
  citedby = {0},
  pages = {795-800},
  booktitle = {Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011},
  editor = {Leon Stok and Nikil D. Dutt and Soha Hassoun},
  publisher = {ACM},
  isbn = {978-1-4503-0636-2},
}