Test Pattern Modification for Average IR-Drop Reduction

Wei-Sheng Ding, Hung-Yi Hsieh, Cheng-Yu Han, James Chien-Mo Li, Xiaoqing Wen. Test Pattern Modification for Average IR-Drop Reduction. IEEE Trans. VLSI Syst., 24(1):38-49, 2016. [doi]

Abstract

Abstract is missing.