On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing

Weichi Ding, Mingde Pan, Wilson Wong, Daniel Chow, Mike Peng Li, Sergey Shumarayev. On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-7, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.