Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh. Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 298-303, IEEE Computer Society, 2005. [doi]
Abstract is missing.