Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen. Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{DobbelaereCCVXG19,
title = {Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs},
author = {Wim Dobbelaere and Frederik Colle and Anthony Coyette and Ronny Vanhooren and Nektar Xama and Jhon Gomez and Georges G. E. Gielen},
year = {2019},
doi = {10.1109/ITC44170.2019.9000123},
url = {https://doi.org/10.1109/ITC44170.2019.9000123},
researchr = {https://researchr.org/publication/DobbelaereCCVXG19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4823-6},
}