Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen. Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.