Innovative practices on quality levels of A/MS devices - researchr publication authors

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Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick. Innovative practices on quality levels of A/MS devices. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]

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