Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick. Innovative practices on quality levels of A/MS devices. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]
@inproceedings{DobbelaereSVPR18,
title = {Innovative practices on quality levels of A/MS devices},
author = {Wim Dobbelaere and On Semi and Massimo Violante and Turin Polytechnic and Jeff Rearick},
year = {2018},
doi = {10.1109/VTS.2018.8368629},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2018.8368629},
researchr = {https://researchr.org/publication/DobbelaereSVPR18},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-3774-6},
}