Jonas Doevenspeck, Robin Degraeve, Stefan Cosemans, Philippe Roussel, Bram-Ernst Verhoef, Rudy Lauwereins, Wim Dehaene. Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications. In 48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018. pages 62-65, IEEE, 2018. [doi]
@inproceedings{DoevenspeckDCRV18,
title = {Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications},
author = {Jonas Doevenspeck and Robin Degraeve and Stefan Cosemans and Philippe Roussel and Bram-Ernst Verhoef and Rudy Lauwereins and Wim Dehaene},
year = {2018},
doi = {10.1109/ESSDERC.2018.8486860},
url = {https://doi.org/10.1109/ESSDERC.2018.8486860},
researchr = {https://researchr.org/publication/DoevenspeckDCRV18},
cites = {0},
citedby = {0},
pages = {62-65},
booktitle = {48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5401-9},
}