Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation

Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty. Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 59-64, ACM Press, 2005. [doi]

Abstract

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