Peter Domanski, Deepesh Sahoo, Eduardo Ortega, Farshad Firouzi, Krishnendu Chakrabarty. LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 121-130, IEEE, 2025. [doi]
Abstract is missing.