A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling - researchr publication authors

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Marco Donato, R. Iris Bahar, William R. Patterson, Alexander Zaslavsky. A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(3):643-656, 2018. [doi]

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