Marco Donato, R. Iris Bahar, William R. Patterson, Alexander Zaslavsky. A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(3):643-656, 2018. [doi]
@article{DonatoBPZ18,
title = {A Sub-Threshold Noise Transient Simulator Based on Integrated Random Telegraph and Thermal Noise Modeling},
author = {Marco Donato and R. Iris Bahar and William R. Patterson and Alexander Zaslavsky},
year = {2018},
doi = {10.1109/TCAD.2017.2717705},
url = {https://doi.org/10.1109/TCAD.2017.2717705},
researchr = {https://researchr.org/publication/DonatoBPZ18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {37},
number = {3},
pages = {643-656},
}