Z. Dong, X. Cao, M. Ahosan Ul Karim, V. Joshi, T. Klick, J. Schmid. Simulation Based Assessment of SRAM Data Retention Voltage. In 20th International Symposium on Quality Electronic Design, ISQED 2019, Santa Clara, CA, USA, March 6-7, 2019. pages 98-103, IEEE, 2019. [doi]
Abstract is missing.