Efficient SRAM failure rate prediction via Gibbs sampling

Changdao Dong, Xin Li. Efficient SRAM failure rate prediction via Gibbs sampling. In Leon Stok, Nikil D. Dutt, Soha Hassoun, editors, Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011. pages 200-205, ACM, 2011. [doi]

@inproceedings{DongL11-6,
  title = {Efficient SRAM failure rate prediction via Gibbs sampling},
  author = {Changdao Dong and Xin Li},
  year = {2011},
  doi = {10.1145/2024724.2024769},
  url = {http://doi.acm.org/10.1145/2024724.2024769},
  researchr = {https://researchr.org/publication/DongL11-6},
  cites = {0},
  citedby = {0},
  pages = {200-205},
  booktitle = {Proceedings of the 48th Design Automation Conference, DAC 2011, San Diego, California, USA, June 5-10, 2011},
  editor = {Leon Stok and Nikil D. Dutt and Soha Hassoun},
  publisher = {ACM},
  isbn = {978-1-4503-0636-2},
}