Swapneel Donglikar, Mainak Banga, Maheshwar Chandrasekar, Michael S. Hsiao. Fast circuit topology based method to configure the scan chains in Illinois Scan architecture. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.