A yield centric statistical design method for optimization of the SRAM active column

T. S. Doorn, J. A. Croon, E. J. W. Ter Maten, A. Di Bucchianico. A yield centric statistical design method for optimization of the SRAM active column. In 35th European Solid-State Circuits Conference, ESSCIRC 2009, Athens, Greece, 14-18 September 2009. pages 352-355, IEEE, 2009. [doi]

Abstract

Abstract is missing.