Tailoring ATPG for embedded testing

Rainer Dorsch, Hans-Joachim Wunderlich. Tailoring ATPG for embedded testing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 530-537, IEEE Computer Society, 2001.

Authors

Rainer Dorsch

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Hans-Joachim Wunderlich

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