Rainer Dorsch, Hans-Joachim Wunderlich. Tailoring ATPG for embedded testing. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 530-537, IEEE Computer Society, 2001.
@inproceedings{DorschW01,
title = {Tailoring ATPG for embedded testing},
author = {Rainer Dorsch and Hans-Joachim Wunderlich},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/DorschW01},
cites = {0},
citedby = {0},
pages = {530-537},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}