Xiaoxin Dou, Weiwei Pan, Zheng Shi, Yongjun Zheng. Design and automatic generation of area-efficient ring oscillator based addressable test chips. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 492-495, IEEE, 2017. [doi]
Abstract is missing.