0.7N Gate

E. A. Douglas, B. A. Klein, A. A. Allerman, Albert G. Baca, T. R. Fortune, A. M. Armstrong. 0.7N Gate. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]

Authors

E. A. Douglas

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B. A. Klein

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A. A. Allerman

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Albert G. Baca

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T. R. Fortune

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A. M. Armstrong

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