E. A. Douglas, B. A. Klein, A. A. Allerman, Albert G. Baca, T. R. Fortune, A. M. Armstrong. 0.7N Gate. In 76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018. pages 1-2, IEEE, 2018. [doi]
@inproceedings{DouglasKABFA18,
title = {0.7N Gate},
author = {E. A. Douglas and B. A. Klein and A. A. Allerman and Albert G. Baca and T. R. Fortune and A. M. Armstrong},
year = {2018},
doi = {10.1109/DRC.2018.8444130},
url = {https://doi.org/10.1109/DRC.2018.8444130},
researchr = {https://researchr.org/publication/DouglasKABFA18},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {76th Device Research Conference, DRC 2018, Santa Barbara, CA, USA, June 24-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-3028-0},
}