A. Douin, V. Pouget, D. Lewis, Pascal Fouillat, Philippe Perdu. Electrical Modeling for Laser Testing with Different Pulse Durations. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 9-13, IEEE Computer Society, 2005. [doi]
Abstract is missing.