M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre. AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 314-321, IEEE Computer Society, 2008. [doi]
Abstract is missing.