Cross-Technology, Cross-Layer Defect Detection in IT Systems - Challenges and Achievements - researchr publication authors

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Philippe-Emmanuel Douziech, Bill Curtis. Cross-Technology, Cross-Layer Defect Detection in IT Systems - Challenges and Achievements. In 1st IEEE/ACM International Workshop on Complex Faults and Failures in Large Software Systems, COUFLESS 2015, Florence, Italy, May 23, 2015. pages 21-26, IEEE, 2015. [doi]

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