Philippe-Emmanuel Douziech, Bill Curtis. Cross-Technology, Cross-Layer Defect Detection in IT Systems - Challenges and Achievements. In 1st IEEE/ACM International Workshop on Complex Faults and Failures in Large Software Systems, COUFLESS 2015, Florence, Italy, May 23, 2015. pages 21-26, IEEE, 2015. [doi]
@inproceedings{DouziechC15,
title = {Cross-Technology, Cross-Layer Defect Detection in IT Systems - Challenges and Achievements},
author = {Philippe-Emmanuel Douziech and Bill Curtis},
year = {2015},
doi = {10.1109/COUFLESS.2015.11},
url = {http://dx.doi.org/10.1109/COUFLESS.2015.11},
researchr = {https://researchr.org/publication/DouziechC15},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {1st IEEE/ACM International Workshop on Complex Faults and Failures in Large Software Systems, COUFLESS 2015, Florence, Italy, May 23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7034-9},
}