Norbert Druml, Manuel Menghin, Tobias Rauter, Christian Steger, Reinhold Weiss, Christian Bachmann, Holger Bock, Josef Haid. Power and Thermal Fault Effect Exploration Framework for Reader/Smart Card Designs. In 2013 Euromicro Conference on Digital System Design, DSD 2013, Los Alamitos, CA, USA, September 4-6, 2013. pages 898-906, IEEE, 2013. [doi]
Abstract is missing.