Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Yankang Du, Shuming Chen, Biwei Liu. Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells. Microelectronics Journal, 44(2):65-71, 2013. [doi]

Authors

Yankang Du

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Shuming Chen

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Biwei Liu

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