Yankang Du, Shuming Chen, Biwei Liu. Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells. Microelectronics Journal, 44(2):65-71, 2013. [doi]
@article{DuCL13,
title = {Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells},
author = {Yankang Du and Shuming Chen and Biwei Liu},
year = {2013},
doi = {10.1016/j.mejo.2012.11.011},
url = {http://dx.doi.org/10.1016/j.mejo.2012.11.011},
researchr = {https://researchr.org/publication/DuCL13},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {44},
number = {2},
pages = {65-71},
}