Xiaogang Du, Sudhakar M. Reddy, Don E. Ross, Wu-Tung Cheng, Joseph Rayhawk. Memory BIST Using ESP. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 243-248, IEEE Computer Society, 2004. [doi]
Abstract is missing.