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A low cost method for testing offset and gain error for ADC BIST

Jingbo Duan, Degang Chen, Randall L. Geiger. A low cost method for testing offset and gain error for ADC BIST. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2023-2026, IEEE, 2012. [doi]

Authors

Jingbo Duan

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Degang Chen

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Randall L. Geiger

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