F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh. Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 119-124, IEEE Computer Society, 2003. [doi]
@inproceedings{DuanCVKR03,
title = {Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability},
author = {F. Duan and R. Castagnetti and R. Venkatraman and O. Kobozeva and S. Ramesh},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/isqed/2003/1881/00/18810119abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/DuanCVKR03},
cites = {0},
citedby = {0},
pages = {119-124},
booktitle = {4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1881-8},
}