F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh. Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 119-124, IEEE Computer Society, 2003. [doi]
Abstract is missing.