Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor - researchr publication authors

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David E. Duarte, Greg Taylor, Keng L. Wong, Usman Mughal, George Geannopoulos. Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor. In Diana Marculescu, Anand Raghunathan, Ali Keshavarzi, Vijaykrishnan Narayanan, editors, Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007, Portland, OR, USA, August 27-29, 2007. pages 304-309, ACM, 2007. [doi]

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