Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis - researchr publication

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Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani. Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. In 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), May 9-11, 2007, Porto Alegre, Brazil. pages 171-178, IEEE Computer Society, 2007. [doi]

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