Profile-Driven Generation of Trace Samples - researchr publication authors

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Pradeep K. Dubey, Ravi Nair. Profile-Driven Generation of Trace Samples. In 1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings. pages 217-224, IEEE Computer Society, 1996. [doi]

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