Pradeep K. Dubey, Ravi Nair. Profile-Driven Generation of Trace Samples. In 1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings. pages 217-224, IEEE Computer Society, 1996. [doi]
@inproceedings{DubeyN96,
title = {Profile-Driven Generation of Trace Samples},
author = {Pradeep K. Dubey and Ravi Nair},
year = {1996},
url = {http://computer.org/proceedings/iccd/7554/75540217abs.htm},
researchr = {https://researchr.org/publication/DubeyN96},
cites = {0},
citedby = {0},
pages = {217-224},
booktitle = {1996 International Conference on Computer Design (ICCD 96), VLSI in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-7554-3},
}