Loris Duch, Miguel Peón Quirós, Pieter Weckx, Alexandre Levisse, Rubén Braojos, Francky Catthoor, David Atienza. Analysis of Functional Errors Produced by Long-Term Workload-Dependent BTI Degradation in Ultralow Power Processors. IEEE Trans. VLSI Syst., 28(10):2122-2133, 2020. [doi]
Abstract is missing.