A BIST-DFT technique for DC test of analog modules

Christian Dufaza, Hassan Ihs. A BIST-DFT technique for DC test of analog modules. J. Electronic Testing, 9(1-2):117-133, 1996. [doi]

Authors

Christian Dufaza

This author has not been identified. Look up 'Christian Dufaza' in Google

Hassan Ihs

This author has not been identified. Look up 'Hassan Ihs' in Google